Chaudhary Devi Lal University - Haryana

26909170 supply of equipment x ray diffractometer for university science instrumentation centre under rusa grant. 1 supplying, installation, testing and commissioning of x ray diffractometer ( xrd ) having 3kw high resolution xrd floor model required for powder diffraction and phase analysis of polycrystalline thin film. the system should be fully computer controlled. quoted model should be supported by manufacturer for the supply of spares for at least 8 years. the instrument shall comprised of following detailed specifications: ni safety full radiation protection chamber with full safe open / close mechanism. leakage of radiation as per international standard. nii x ray generator na ) maximum power output: 3.0 kw or higher. nb ) maximum output voltage: 50kv or higher nc ) maximum current: 2 50 ma or higher nd ) stability of generator: +0.05% 0.005% for 10% variation in main supply niii x ray tube cu target, ceramic insulations with kß filter niv goniometer na ) vertically mounted and should be theta theta geometry nb ) two theta range: minimum 3 to160 deg. or better nc ) scanning mode: ?s / ?d coupled; or ?s, ?d independent nd ) step size: 0.0001 deg. or better ne ) goniometer radius: 250 mm or better nv sample holders for powder – 20 nos. nvi detector na ) fast detector based on solid state technology with 0d and 1d mode. it should also work in fluorescence reduction mode. nvii optics nfully automatic alignment including source height and angle, goniometer incident beam optics, slit height, sample surface and detector nviii fully computer controlled slit system. nix sample stage na ) standard stage for powder diffraction nx calibration standard na ) the vendor must provide data quality guarantee on the angular position and intensity ratio carried out on nist sample. nxi software ( fully automatic control with should guidance facility ) ndata acquisition and processing na ) fully automatic profile fitting nb ) integrated intensity calculation nc ) crystallite size calculation ( scherrer method ) nd ) background subtraction and smoothing ne ) ka2 elimination and peak search nf ) multiple peak separation and multiple plotting ng ) task macros and icdd access nh ) file history and thumbnails ni ) creation of various type of reports nj ) 2? correction nk ) pattern simulation from d i list. nl ) 3d multiple pattern display nm ) crystal structure data ( cif ) input and output nn ) 3d crystal structure display no ) rir quantitative analysis np ) hybrid search / match algorithms which combines the features of peak based and profile based phase identification techniques. it offers improves qualitative analysis performance which makes identification of crystalline phases with preferred orientation or a complex lattice deformation. nxii installation & commissioning ninstallation, testing, commissioning and training should be included in the price. nxiii warranty nwarranty at least one year nxiv notes nthe complete set of documentations, manuals and software manuals should be provided both in softcopy and hard copy. nxv user list: provide user list for xrd 3kw. nnote: the quoted model should be fully upgradable for high resolution thin film, saxc, micro area diffraction and non ambient sample analysis. n nindegeneous items nxvi computer and printer ncompatible pc with colour laser printer ( as per system requirement ) must be offered nxvii compatible ups ncompatible as per system requirement for atleast 30 minutes backup nxviii chiller unit nneed full chiller unit should be quoted with the instrument n item1 1 each...